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A suitable short-time test for analysis of long term stability is presented for the case of passivated NiCr thin film resistors revealing an aging characteristic which is not of Arrhenius type. Based ...
Investigations on RF sputtered NiCr thin film resistors, fabricated using Cu as conductor metallization, were made. The contact resistance characteristics, resistor film characteristics and TCR of the...
In this paper a sensitive measuring circuit is described for the measurement of current noise on high quality thin and thick film resistors. Measured data on resistors are presented and analysed.
A computer program has been developed, which calculates any adjustable thin film resistor from simple input data (electrical, geometrical, positional, orientational), punched on input cards”. The “ou...

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