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Phase Identification and AES Depth Profile Analysis of Cu(In,Ga)Se2 Thin Films
CIGS Solar cells XRD AES
2010/9/29
This work presents results related with phase identification and study of the homogeneity in the chemical composition of Cu(In,Ga)Se2 (CIGS) thin films grown by a chemical reaction of the precursor sp...
Clutter and rainfall discrimination by means of doppler-polarimetric measurements and vertical reflectivity profile analysis
Clutter and rainfall discrimination doppler-polarimetric measurements vertical reflectivity profile analysis
2010/1/22
The estimation of rainfall rate and other parameters from radar scattering volume is heavily affected by the presence of intense sea and ground clutter and echoes which appears in anomalous propagatio...
Characterization of Intercalated Smectites Using XRD Profile Analysis in the Low-Angle Region
Montmorillonite Profile Analysis Smectite XRD
2011/12/2
Abstract: X-ray diffraction (XRD) characterization of natural and intercalated smectites is usually limited to the apparent d-value estimated from the peak maxima in the raw data. This can lead to the...