搜索结果: 1-4 共查到“电子科学与技术 Defect”相关记录4条 . 查询时间(0.036 秒)
Analysis of Orange Peel Defect in St14 Steel Sheet by Electron Backscatter Diffraction (EBSD)
2007/7/28
期刊信息
篇名
Analysis of Orange Peel Defect in St14 Steel Sheet by Electron Backscatter Diffraction (EBSD)
语种
英文
撰写或编译
撰写
作者
曹圣泉,张津徐,吴建生,陈家光
第一作者单位
刊物名称
J. Mat.Sci. Tec
页面
2005, 21(1): 17-20.
出版日期
2005年
月...
Characterization of Defect Traps in SiO2 Thin Films
Gate oxide MOS capacitor C-V characteristics Hysteresis Slow-state traps
2010/12/8
In order to understand the degradation of the electrical operations of metal-oxide-semiconductor (MOS) devices, this work is concerned by the defects generation processes in the non-stoichiometric SiO...
Modeling of Interface Defect Distribution for an n-MOSFETs Under Hot-Carrier Stressing
n-MOSFET Defects Stress Hot-carrier Aging
2010/12/8
We propose to model the evolution of the interface defect density, induced by the hot-carrier-injection, during stress time for n-MOSFET transistor. This interface defect density is modeled by a spati...
Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance
Defect Density Electrical Properties Vacuum Evaporated Copper Films Electrical Resistance
2010/12/28
Copper films (210 – 1650 Å) were deposited onto glass microslides by vacuum evaporation. The films were subjected to heat treatment at a constant rate and the variation of electrical resistance ...