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Modeling of Interface Defect Distribution for an n-MOSFETs Under Hot-Carrier Stressing
n-MOSFET Defects Stress Hot-carrier Aging
2010/12/8
We propose to model the evolution of the interface defect density, induced by the hot-carrier-injection, during stress time for n-MOSFET transistor. This interface defect density is modeled by a spati...