搜索结果: 1-15 共查到“会议中心 Microscopy”相关记录17条 . 查询时间(0.068 秒)
2018年SPIE内窥镜显微镜会议（SPIE Endoscopic Microscopy XIII）。
2018年SPIE三维和多维显微镜：图像采集和处理会议（SPIE Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV）
2018年 SPIE三维 多维显微镜 图像采集 处理 会议
2017/11/28
2018年SPIE三维和多维显微镜：图像采集和处理会议（SPIE Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXV）。
The “International Forum on Surface and Microscopy, 2017” (IFSM 2017) symposium is the second special conference for optical microscopic imaging in China, bringing together professionals engaged in op...
2017冷冻电子显微镜先进图像处理国际研讨会（International Workshop of Advanced Image Processing of Cryo-Electron Microscopy）
2017 冷冻电子显微镜 先进图像处理 国际研讨会
2017/7/6
Structural biology has become one of most important tools to understand the fundamental principles of life. CryoEM has multiple advantages to investigate the structures of macromolecular machineries i...
第20届非接触原子力显微镜国际会议（20th International Conference on Non-Contact Atomic Force Microscopy）
第20届 非接触原子力 显微镜 国际会议
2017/7/6
NC-AFM 2017 is the 20th international conference on Non-Contact Atomic Force Microscopy (NC-AFM), which is one of the most influential conference series in the field of scanning probe microscopy.
Since the invention in 1980s, scanning probe microscopy (SPM) has been considered as the valuable avenue to visualize topography of sample in nanoscale. After more than 30-year development, SPMs have ...
2017计算机视觉显微镜图像分析研讨会（The Workshop on Computer Vision for Microscopy Image Analysis）(CVMI)
2017年 计算机视觉显微镜图像分析 研讨会
2017/6/22
The Workshop on Computer Vision for Microscopy Image Analysis (CVMI) will be held on July 21st, 2017 in conjunction with the CVPR 2017 conference. It is focused primarily on analyzing microscopy image...
“材料电子显微技术——未来十年”国际会议（Nature Conference on Electron Microscopy for Materials-The Next Ten Years）
材料电子显微技术——未来十年 国际会议
2017/4/25
Electron microscopy has been a key enabling technique for advancing our understanding of the structure and behaviour of materials: atomic-scale imaging of atoms and defects has led to substantial brea...
Electron microscopy has been a key enabling technique for advancing our understanding of the structure and behaviour of materials: atomic-scale imaging of atoms and defects has led to substantial brea...
2016年动态材料现象的原位电子显微镜技术研讨会（Symposium CM4—In Situ Electron Microscopy of Dynamic Materials Phenomena）
动态材料现象 原位电子显微镜技术 研讨会
2017/2/15
In recent years, in situ transmission electron microscopy (TEM) has been well recognized as a powerful tool for the study of materials dynamic processes. For instance, it has been possible to reveal s...
第二届表面与显微术国际论坛（The 2nd International Forum on Surface and Microscopy）
表面与显微术 国际论坛 光学显微成像 纳米显微镜技术 高光谱成像技术
2017/2/15
2015年7月23-25日在哈尔滨召开国内首个光学显微成像的专题会议，为持续促进本领域技术的完善与发展，学会定于2017年8月7-9日召开第二届会议。旨在汇聚从事光学显微技术的专业人员开展学术交流，为科研工作者提供一个展示前瞻性观点，探讨关键技术的平台。会议主题不仅包括光学显微技术研究与应用的广泛领域，如：纳米显微镜技术、高光谱成像技术、非线性激发显微成像、荧光相关光谱技术、光学相干层析成像、共聚...
2017年第17届生物医学科学多光子显微镜研讨会（Multiphoton Microscopy in the Biomedical Sciences XVII）
Keynote Session Technology Development
2017/1/20
Conference attendees are invited to attend the BiOS poster session on Sunday evening. Come view the posters, enjoy light refreshments, ask questions, and network with colleagues in your field. Authors...
BiOS is organized into six tracks. Choose a track and click to see the list of conferences.Review conference details by clicking on the titles below. These details include paper titles, authors, sched...
2017三维电子显微镜戈登学术会议（The 2017 Gordon Research Conference on Three Dimensional Electron Microscopy）
2017 三维电子显微镜戈登 学术会议
2017/1/11
The 2017 GRC on Three-Dimensional Electron Microscopy (3DEM) continues a tradition of more than 30 years of 3DEM GRCs.Technical breakthroughs have led to period of explosive growth in 3DEM, which has ...
Advanced and Analytical Microscopy and Spectroscopy of Nanostructures and Engineering Materials
optics communications
2016/7/25
The symposium aims at providing a forum for researchers interested in applying advanced methods of electron microscopy and spectroscopy, including aberration-corrected electron microscopy, and in-situ...